O Series XRF
PWBs, lead frames, thin wires, wafers
The O Series combines high performance with a small x-ray spot size. This is made possible by the poly-capillary focusing optics system that replaces the collimator assembly installed in standard Bowman systems. The optics are designed to focus the x-rays coming from the tube exit window to a very small spot size (80μm FWHM) while retaining virtually 100% of the tube flux. So instead of attenuating the x-rays that can’t fit through the small apertures, as is the case with collimator systems, the poly-capillary optics assembly allows almost all of the x-rays from the tube to reach the sample. The result is much greater sensitivity for testing very small components or thin coatings. Shorter test times can achieve even better repeatability when comparing optics systems vs. a similar sized collimator.
The standard configuration includes the 80μm optics, along with a high resolution SDD detector that can process the higher count rates. The camera has a greater magnification compared to other models like the P Series, with a 55x video magnification and 7x higher digital zoom. A programmable X-Y sample stage is also standard. The optics system has a very close focal distance, so O Series samples must be flat.
Now available with extended stage option
Application Performance
| ENEPIG | Electroless Nickel | ||||
|---|---|---|---|---|---|
| μm Au | μm Pd | μm Ni | μm NiP | μm %P | |
| Ave | 0.043 | 0.08 | 3.72 | 10.202 | 10.17 |
| StdDev | 0.0005 | 0.0009 | 0.00010 | 0.1089 | 0.29 |
| Range | 0.0015 | 0.0030 | 0.040 | 0.3863 | 0.9900 |
| %RSD | 1.05% | 1.13% | 0.03% | 1.07% | 2.85% |
The O Series XRF is best suited to customers with these requirements:
- Very small parts/features such as semiconductors, connectors, or PCBs
- Requirements to test many samples or locations per new lot of material
- Need to measure very thin coatings (<100nm)
- Very short measurement times (1-5 seconds)
- Guaranteed to meet IPC-4552, 4553A, 4554 and 4556
- ASTM B568 and ISO 3497
- The desire to upgrade an old XRF’s performance and efficiency – and get a generous trade-in bonus!
Product Specifications
| X-ray excitation: | 50 W W-target with Capillary Optics @80um FWHM at 17 KeV |
| Detector: | Large window Silicon drifted detector with 190eV resolution or better |
| Number of analysis layers and elements: |
5 layers (4 layers + base) and 10 elements in each layer with composition analysis of up to 30 elements simultaneously |
| Filters/Collimators: | 4 primary filters |
| Output Focal Depth: | Fixed at 0.1″ (2.54mm) |
| Digital Pulse Processing: | 4096 CH digital multi-channel analyser with flexible shaping time Automatic signal processing including dead time correction and escape peak correction |
| Computer: | Intel CORE i5 9th gen. desktop processor, solid state hard drive, 16GB RAM, Microsoft Windows 11 Professional 64bit equivalent |
| Camera optics: | 1/4″ (6mm) CMOS-1280×720 VGA resolution |
| Video Magnification: | 55X Micro with 7X Digital Zoom |
| Power Supply: | 150W, 100-240 volts, with frequency range of 47Hz to 63Hz |
| Working Environment: | 68°F (20°C) to 77°F (25°C) and up to 98% RH, non-condensing |
| Weight: | 52-70kg |
| Programmable XY: | Table size: 330mm (13″) x 381mm (15″)| Travel: 127mm (5″) x 152mm (6″) Now available with optional extended stages or enclosed chamber |
| Internal Dimensions: | Height: 140mm (5.5″), Width: 305mm (12″), Depth: 330mm (13″) |
| External Dimensions: | Height: 457mm (18″), Width: 457mm (18″), Depth: 610mm (24″) |